@article{oai:miyazaki-u.repo.nii.ac.jp:00000967,
 author = {鄧, 鋼 and Den, Gan and 鐙, 鋼 and 徳永, 仁夫 and Tokunaga, Hitoo and 池田, 清彦 and Ikeda, Kiyohiko and 中西, 勉 and Nakanishi, Tsutomu and Kaizu, Koichi and 海津, 浩一 and Redda, Tilahun Daniel and 徳永, 仁夫 and Tokunaga, Hitoo and Redda, Tilahun Daniel and 中西, 勉 and Nakanishi, Tsutomu},
 issue = {715},
 journal = {日本機械学會論文集. C編, Transactions of the Japan Society of Mechanical Engineers. C},
 month = {Mar},
 note = {Crack length measurement and crack initiation detection in a fatigue process are extremely important techniques in the researches for the investigation of crack growth characteristics and the fatigue strength evaluation of machine elements. The purpose of this research is to show a simple and high precision method to measure the length of a crack as well as a micro crack using an
extremely thin ion sputtered film. A grid pattern ion sputtered film was proposed to measure the crack length for a bending test specimen. Based on the comparisons between the measurement results and that by a microscope, it was clarified that the grid pattern ion sputtered film has a very high measurement precision. This method should be invaluable and practicable for the crack length measurement of insulating materials such as ceramics. Meanwhile, a rectangle ion sputtered film was used on a metal bending specimen, the possibility to apply the film in the crack length measurement of a metal machine element was confirmed by the change of the electric resistance of the film with crack growth.},
 pages = {997--1002},
 title = {スパッタ金属膜によるき裂長さの測定},
 volume = {72},
 year = {2006},
 yomi = {デン, ガン and トウ, コウ and トクナガ, ヒトオ and イケダ, キヨヒコ and ナカニシ, ツトム and カイズ, コウイチ and トクナガ, ヒトオ and ナカニシ, ツトム}
}