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Optimization Frequency Design of Eddy Current Testing
http://hdl.handle.net/10458/1943
http://hdl.handle.net/10458/1943ad7a4d86-6994-44d3-9f98-2bcbf8f7f642
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
25-808.pdf (399.3 kB)
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||
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| 公開日 | 2009-03-06 | |||||
| タイトル | ||||||
| タイトル | Optimization Frequency Design of Eddy Current Testing | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| キーワード | Nondestructive, eddy current, thickness of films, optimal frequency | |||||
| 資源タイプ | ||||||
| 資源タイプ | journal article | |||||
| 著者 |
Mungkung, Narong
× Mungkung, Narong× Chomsuwan, Komkrit× Pimpru, Narong× 湯地, 敏史 |
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| 抄録 | ||||||
| 内容記述タイプ | Abstract | |||||
| 内容記述 | The purposes of this research were to construct the nondestructive metal testing intrument by using eddy current method and to find an optimal frequency for the metal testing intrument. The testing intrument consist of a sine wave oscillator circuit which can adjust the frequency between 20 – 90 kHz, and a 50 ohms sensor circuit. There are three kinds of testing intrument. The first was the nondestructive imperfection testing by using eddy current method. The sample irons are constructed with different imperfection on surface. The output signals of testing from the sensor circuit are compared. The second was the nondestructive categorization metal testing by using eddy current method. Many kinds of metals are taken to testing. The last one was the nondestructive testing for finding the thickness of films on iron by using eddy current method. In this testing the thickness of films varied between 100 – 700 microns. In all testing, differences of the signal testing were compared to analyze the optimal frequency for the testing intrument. The results of research showed that the nondestructive metal testing intrument by using eddy current method can be used to find a different imperfective iron, categorize the metal and find thickness of films. In addition, the range of an optimal frequency is 30 kHz to 70 kHz for testing intrument. | |||||
| 言語 | en | |||||
| 書誌情報 |
en : WSEAS transactions on circuits and systems 巻 7, 号 4, p. 213-217, 発行日 2008-04 |
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| 出版者 | ||||||
| 出版者 | World Scientific and Engineering Academy and Society | |||||
| 言語 | en | |||||
| ISSN | ||||||
| 収録物識別子タイプ | ISSN | |||||
| 収録物識別子 | 11092734 | |||||
| 書誌レコードID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AA12168894 | |||||
| 著者版フラグ | ||||||
| 出版タイプ | VoR | |||||
