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The Effect of Thickness Layer on ITO Nanostructure Prepared by Oblique Angle Deposition
http://hdl.handle.net/10458/6862
http://hdl.handle.net/10458/6862f15d0704-d5fe-4cdc-9482-59e4d2121f6c
名前 / ファイル | ライセンス | アクション |
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2020-06-22 | |||||
タイトル | ||||||
タイトル | The Effect of Thickness Layer on ITO Nanostructure Prepared by Oblique Angle Deposition | |||||
言語 | en | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | ITO nanostructure, Evaporation, Oblique angle deposition | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
Nuchuay, Peerapong
× Nuchuay, Peerapong× T, Chaikeeree× N, Kasayapanand× Mungkung, Narong× Arunrungrusmi, Somchai× M, Horprathum× Eiamchai, P.× S, Limwichean× V, Patthanasettakul× N, Nuntawong× C, Oros× S, Denchitcharoen× B, Samransuksamer× P, Chindaudom |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | The oblique-angle deposition (OAD) technique was studied in this work. The thin films solar cell Indium doped tin oxide (ITO) were synthesized by the electron-beam evaporation with oblique angle deposition technique .The physical properties of crystalline nanostructured thin films can be analyzed by the grazing-incident X-rad diffraction(GIXRD), field-emission scanning electron microscopy(FE-SEM),UV-Vis spectrophotometer and four-point probe measurements, respectively. The FE-SEM results showed that the increased thickness layer greatly affected the morphologies and the GIXRD method was considered mostly polycrystalline with the cubic bixbite structure of the ITO nanostructures. Finally, the optical transmission of the ITO nanostructure films exhibited higher than 85% in the visible range. | |||||
言語 | en | |||||
書誌情報 |
en : International Conference on Science, Technology & Education (ICSTE 2016) p. 281-284, 発行日 2016-09 |
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出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |