{"created":"2023-05-15T10:01:25.252843+00:00","id":5991,"links":{},"metadata":{"_buckets":{"deposit":"9bf2663a-eb83-4eb6-b6e6-f02b994c0227"},"_deposit":{"created_by":5,"id":"5991","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"5991"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00005991","sets":["71","71:35"]},"author_link":["32051","24","197"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-09","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"116","bibliographicPageStart":"113","bibliographic_titles":[{"bibliographic_title":"International Conference on Science, Technology & Education (ICSTE 2016)","bibliographic_titleLang":"en"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This research purposes a development skill in electrical switchboard automatic transfer switch (ATS) testing for technician, engineer and electrical technologies, to create manual and process in ATS testing, and to decreasing damaged or decreasing duplication of ATS testing. The sample data from staff's Asefa Co., Ltd was about 20 people which are derived selected by mode, procedures, and the basics study information, types of the relevant standards with ATS testing, and including schedule testing. Built to test the samples before and after the test analyzed development circuit control system. The resulted of sample was found that error about 1 %.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10003_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"P, Phoomglin","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"32051","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Mungkung, Narong","creatorNameLang":"en"}],"familyNames":[{"familyName":"Mungkung","familyNameLang":"en"}],"givenNames":[{"givenName":"Narong","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"197","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"湯地, 敏史","creatorNameLang":"ja"},{"creatorName":"ユジ, トシフミ","creatorNameLang":"ja-Kana"},{"creatorName":"Yuji, Toshifumi","creatorNameLang":"en"},{"creatorName":"Yuji, Tosifumi","creatorNameLang":"en"}],"familyNames":[{"familyName":"湯地","familyNameLang":"ja"},{"familyName":"ユジ","familyNameLang":"ja-Kana"},{"familyName":"Yuji","familyNameLang":"en"},{"familyName":"Yuji","familyNameLang":"en"}],"givenNames":[{"givenName":"敏史","givenNameLang":"ja"},{"givenName":"トシフミ","givenNameLang":"ja-Kana"},{"givenName":"Toshifumi","givenNameLang":"en"},{"givenName":"Tosifumi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"24","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80418988","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=80418988"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"icste2016_p113.pdf","filesize":[{"value":"775.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文","url":"https://miyazaki-u.repo.nii.ac.jp/record/5991/files/icste2016_p113.pdf"},"version_id":"94537bc7-2a73-454f-8217-f4657ea37f9e"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Automatic transfer switch, performance, error value, cost of the damage.","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Competency based Skill Development on Automatic Transfer Switch: ATS, Testing for Technician, Engineer and Electrical Technologies","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Competency based Skill Development on Automatic Transfer Switch: ATS, Testing for Technician, Engineer and Electrical Technologies","subitem_title_language":"en"}]},"item_type_id":"10003","owner":"5","path":["71","35"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-06-21"},"publish_date":"2020-06-21","publish_status":"0","recid":"5991","relation_version_is_last":true,"title":["Competency based Skill Development on Automatic Transfer Switch: ATS, Testing for Technician, Engineer and Electrical Technologies"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2024-11-15T07:34:29.250583+00:00"}