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Study on Deterioration Test by Variable Load and Thermal Acceleration Test of The Electric Double Layer Capacitor
http://hdl.handle.net/10458/6784
http://hdl.handle.net/10458/678461b9222b-4f32-4393-87dc-661083dc3798
名前 / ファイル | ライセンス | アクション |
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2020-06-21 | |||||
タイトル | ||||||
タイトル | Study on Deterioration Test by Variable Load and Thermal Acceleration Test of The Electric Double Layer Capacitor | |||||
言語 | en | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | EDLC, Thermal acceleration test, Variable load, Deterioration, Charge and discharge | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_5794 | |||||
資源タイプ | conference paper | |||||
著者 |
T., Bouno
× T., Bouno× K., Miura× T., Yuji× N., Kamata |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Recently, electric energy is indispensable. It is always required that the energy generated must match consumption. However, in reality it is necessary to increase the generated powers, which result in surplus electric power. In order to make effective use of electricity power, it is necessary to eliminate the difference between this power supply and the power consumption. In regards to this problem, attention is given to electricity storage devices. An electric double layer capacitor is an electric storage device that has been attracting attention recently. The purpose of this research is to obtain basic data for prevention/ conservation by investigating deterioration/life characteristics of electric double layer capacitors using a thermostatic oven. For that purpose, a thermostatic oven was prepared, the relay circuit was repaired and a charge/discharge changeover program was written. The deterioration test started from October and it took about 30 days. The lifetime the capacitor was defined as the value where the electrostatic capacity was reduced by 20% from the original value. However, as the experiment progressed, in about 27 days, liquid cracks out of the capacitor due to the crack of the electric double layer capacitor. Since it did not cause short circuit, it was judged as deterioration. Since the temperature around the electric double layer capacitor in the thermostatic box was within the rated temperature range described by the manufacturer, this number of days is considered to be the lifetime at 60 °C. | |||||
言語 | en | |||||
書誌情報 |
en : International Conference on Applied Electrical and Mechanical Engineering 2019 p. 155-157, 発行日 2019-09 |
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著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 |