{"created":"2023-05-15T10:01:20.559778+00:00","id":5884,"links":{},"metadata":{"_buckets":{"deposit":"d987ce74-ba7c-4db2-a346-f7ef4fefcf01"},"_deposit":{"created_by":5,"id":"5884","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"5884"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00005884","sets":["73","73:36","73:36:330","73:36:330:329"]},"author_link":["31593","6484","31595"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"VDM++ シヨウ オ タイショウ トシ タ テスト ケース ジドウセイセイ ツールBWDM ヘ ノPICT ノ テキヨウ","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-07","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"148","bibliographicPageStart":"143","bibliographicVolumeNumber":"48","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In recent years, specifications using specification language become more important. It is necessary to test the developed software, but it takes much time and effort to design test cases manually. So, we developed BWDM(Boundary Value Vienna Develop Method). BWDM is a test case generation tool for the VDM++ specification. However, the existing BWDM could cause a combinatorial explosion of the generated test cases. There is a pairwise testing as an effective testing method to reduce the total number of the combinations because the pairwise testing only generates test cases which satisfy combinations of two pairs. We apply the pairwise testing into BWDM. In applying the pairwise testing, we use PICT (Pairwise Independent Combinatorial Testing Tool) developed by Microsoft Corporation. However, BWDM cannot call PICT library directly. Hence, we have developed PICT-wrapper. It is an interface to connect PICT and BWDM. We extend BWDM in that PICT-wrapper is embedded. The extended BWDM eliminate the possibility of the combinatorial explosion.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"平木場, 風太","creatorNameLang":"ja"},{"creatorName":"ヒラコバ, フウタ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Katayama, Tetsuro","creatorNameLang":"en"},{"creatorName":"片山, 徹郎","creatorNameLang":"ja"},{"creatorName":"カタヤマ, テツロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Hirakoba, Futa","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"143-148.pdf","filesize":[{"value":"1.6 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文","url":"https://miyazaki-u.repo.nii.ac.jp/record/5884/files/143-148.pdf"},"version_id":"2c4f2caf-48c8-469e-814d-587779abee62"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"software testing, boundary value analysis, pairwise testing, PICT, VDM++","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"VDM++ 仕様を対象としたテストケース自動生成ツールBWDM へのPICT の適用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"VDM++ 仕様を対象としたテストケース自動生成ツールBWDM へのPICT の適用","subitem_title_language":"ja"},{"subitem_title":"Application of PICT into BWDM which is a Test Case Generation Tool for the VDM++ Specification","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","329"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-06-21"},"publish_date":"2020-06-21","publish_status":"0","recid":"5884","relation_version_is_last":true,"title":["VDM++ 仕様を対象としたテストケース自動生成ツールBWDM へのPICT の適用"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2023-07-29T11:36:47.389371+00:00"}