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This impulse generator is used to test conductor bar material in 3 Phase 4 Wire 400V,1600 A and 2500 A. The conductor bars that are designed to withstand a voltage test at a frequency of resistance impulse. Increasing the temperature according to the criteria and the resistance of the insulation can be used as a standard.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10003_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tanapan, Nopsoongnoen","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31068","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Jenjira, Pratin","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31069","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sanhawat, Janwiboon","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"31070","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Arunrungrusmi, Somchai","creatorNameLang":"en"}],"familyNames":[{"familyName":"Arunrungrusmi","familyNameLang":"en"}],"givenNames":[{"givenName":"Somchai","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"505","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Mungkung, Narong","creatorNameLang":"en"}],"familyNames":[{"familyName":"Mungkung","familyNameLang":"en"}],"givenNames":[{"givenName":"Narong","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"197","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"湯地, 敏史","creatorNameLang":"ja"},{"creatorName":"ユジ, トシフミ","creatorNameLang":"ja-Kana"},{"creatorName":"Yuji, Toshifumi","creatorNameLang":"en"},{"creatorName":"Yuji, Tosifumi","creatorNameLang":"en"}],"familyNames":[{"familyName":"湯地","familyNameLang":"ja"},{"familyName":"ユジ","familyNameLang":"ja-Kana"},{"familyName":"Yuji","familyNameLang":"en"},{"familyName":"Yuji","familyNameLang":"en"}],"givenNames":[{"givenName":"敏史","givenNameLang":"ja"},{"givenName":"トシフミ","givenNameLang":"ja-Kana"},{"givenName":"Toshifumi","givenNameLang":"en"},{"givenName":"Tosifumi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"24","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"80418988","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=80418988"}]},{"creatorNames":[{"creatorName":"Nuttee, Thungsuk","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"26557","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"p199_icste2018.pdf","filesize":[{"value":"882.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文","url":"https://miyazaki-u.repo.nii.ac.jp/record/5774/files/p199_icste2018.pdf"},"version_id":"e310d0b5-aa01-4b3c-af4f-fd42970f9862"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Impulse voltage, withstand voltage, Power System Stability","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Impulse Voltage for Testing a Low Voltage Bust duct Performances","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Impulse Voltage for Testing a Low Voltage Bust duct Performances","subitem_title_language":"en"}]},"item_type_id":"10003","owner":"5","path":["71","35"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-06-21"},"publish_date":"2020-06-21","publish_status":"0","recid":"5774","relation_version_is_last":true,"title":["Impulse Voltage for Testing a Low Voltage Bust duct Performances"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2024-11-15T07:34:21.751485+00:00"}