@article{oai:miyazaki-u.repo.nii.ac.jp:00004562,
 author = {佐藤, 庄一郎 and 福嶋, 晋一 and Fukushima, Shin-ichi and 田中, 秀司 and 境, 健太郎 and Sakai, Kentaro and Fukuyama, Atsuhiko and 福山, 敦彦 and Ikari, Tetsuo and 碇, 哲雄 and Sato, Shoichiro and 福嶋, 晋一 and Fukushima, Shin-ichi and Tanaka, Shuji},
 journal = {Semiconductor Device Research Symposium, 2005 International},
 month = {Dec},
 pages = {410--411},
 title = {Investigation of Ni Induced Deep Levels in N-Type Si by a Temperature Dependence of Piezoelectric Photothermal and Surface Photovoltage Signals},
 year = {2005},
 yomi = {サトウ, ショウイチロウ and フクシマ, シンイチ and タナカ, シュウジ and サカイ, ケンタロウ and フクヤマ, アツヒコ and イカリ, テツオ and フクシマ, シンイチ}
}