{"created":"2023-05-15T10:48:14.851546+00:00","links":{},"metadata":{"_buckets":{"deposit":"f672f2da-d653-4f6c-a638-d98546f4e040"},"_deposit":{"id":"4212.1","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"4212.1"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00004212.1","sets":["73:27"]},"author_link":["5526","21960","5610","21963","21964"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-05-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"198","bibliographicPageStart":"195","bibliographicVolumeNumber":"2006","bibliographic_titles":[{"bibliographic_title":"機素潤滑設計部門講演会講演論文集","bibliographic_titleLang":"ja"},{"bibliographic_title":"The Machine Design and Tribology Division meeting in JSME","bibliographic_titleLang":"en"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Crack length measurement and crack initiation detection in a fatigue process are extremely important techniques in the researches for the investigation of crack growth characteristics and the fatigue strength evaluation of machine elements. The purpose of this research is to show a simple and high precision method to measure the length of a crack as well as a micro crack using an extremely thin ion sputtered film. A grid pattern ion sputtered film was proposed to measure the crack length for a bending test specimen. Based on the comparisons between the measurement results and that by a microscope, it was clarified that the grid pattern ion sputtered film has a very high measurement precision. This method should be invaluable and practicable for the crack length measurement of insulating materials such as ceramics.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10003_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本機械学会","subitem_publisher_language":"ja"}]},"item_10003_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11901260","subitem_source_identifier_type":"NCID"}]},"item_10003_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13483919","subitem_source_identifier_type":"ISSN"}]},"item_10003_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"鄧, 鋼","creatorNameLang":"ja"},{"creatorName":"デン, ガン","creatorNameLang":"ja-Kana"},{"creatorName":"Den, Gan","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5526","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"90237040","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=90237040"}]},{"creatorNames":[{"creatorName":"奈須, 光太郎","creatorNameLang":"ja"},{"creatorName":"ナス, コウタロウ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"21960","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"中西, 勉","creatorNameLang":"ja"},{"creatorName":"ナカニシ, ツトム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"5610","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nasu, Koutarou","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"21963","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nakanishi, Tsutomu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"21964","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"jsme06-6.pdf","filesize":[{"value":"571.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文","url":"https://miyazaki-u.repo.nii.ac.jp/record/4212.1/files/jsme06-6.pdf"},"version_id":"709f37e5-f4c7-4216-a991-ae3ff28590bc"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Crack Length Measurement, Thin film, Ion Sputtered Film, Micro-Crack","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"イオンスパッタグリッド金属膜によるき裂長さの測定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"イオンスパッタグリッド金属膜によるき裂長さの測定","subitem_title_language":"ja"},{"subitem_title":"Crack Length Measurement with an Ion Sputtered Grid Pattern Metal Film","subitem_title_language":"en"}]},"item_type_id":"10003","owner":"2","path":["27"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-06-21"},"publish_date":"2020-06-21","publish_status":"0","recid":"4212.1","relation_version_is_last":true,"title":["イオンスパッタグリッド金属膜によるき裂長さの測定"],"weko_creator_id":"2","weko_shared_id":2},"updated":"2023-07-09T23:55:59.453214+00:00"}