{"created":"2023-05-15T09:59:56.628031+00:00","id":4208,"links":{},"metadata":{"_buckets":{"deposit":"9be4ed3b-67ee-4a7e-b616-43ff78a4c489"},"_deposit":{"created_by":5,"id":"4208","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"4208"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00004208","sets":["73","73:27"]},"author_link":["7290","7289"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2005-02-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"86","bibliographicPageStart":"82","bibliographicVolumeNumber":"34","bibliographic_titles":[{"bibliographic_title":"光学"},{"bibliographic_title":"Japanese Journal of Optics","bibliographic_titleLang":"en"}]}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本光学会"},{"subitem_publisher":"The Optical Society of Japan"},{"subitem_publisher":"応用物理学会分科会日本光学会"}]},"item_10001_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://ci.nii.ac.jp/naid/10014359621"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://ci.nii.ac.jp/naid/10014359621","subitem_relation_type_select":"URI"}}]},"item_10001_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"03896625","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"碇, 哲雄","creatorNameLang":"ja"},{"creatorName":"イカリ, テツオ","creatorNameLang":"ja-Kana"},{"creatorName":"Ikari, Tetsuo","creatorNameLang":"en"}],"familyNames":[{"familyName":"碇","familyNameLang":"ja"},{"familyName":"イカリ","familyNameLang":"ja-Kana"},{"familyName":"Ikari","familyNameLang":"en"}],"givenNames":[{"givenName":"哲雄","givenNameLang":"ja"},{"givenName":"テツオ","givenNameLang":"ja-Kana"},{"givenName":"Tetsuo","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7290","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"70113214","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=70113214"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"福山, 敦彦","creatorNameLang":"ja"},{"creatorName":"フクヤマ, アツヒコ","creatorNameLang":"ja-Kana"},{"creatorName":"Fukuyama, Atsuhiko","creatorNameLang":"en"}],"familyNames":[{"familyName":"福山","familyNameLang":"ja"},{"familyName":"フクヤマ","familyNameLang":"ja-Kana"},{"familyName":"Fukuyama","familyNameLang":"en"}],"givenNames":[{"givenName":"敦彦","givenNameLang":"ja"},{"givenName":"アツヒコ","givenNameLang":"ja-Kana"},{"givenName":"Atsuhiko","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7289","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10264368","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=10264368"}]}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"piezoelectric photothermal spectroscopy, nonradiative electron transitions, semiconductor thin layers","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"圧電素子光熱分光法による半導体薄膜の評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"圧電素子光熱分光法による半導体薄膜の評価","subitem_title_language":"ja"},{"subitem_title":"Investigation of Semiconductor Thin Films by Means of a Piezoelectric Photothermal Spectroscopy","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"5","path":["73","27"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-06-21"},"publish_date":"2020-06-21","publish_status":"0","recid":"4208","relation_version_is_last":true,"title":["圧電素子光熱分光法による半導体薄膜の評価"],"weko_creator_id":"5","weko_shared_id":-1},"updated":"2025-01-07T01:52:20.864499+00:00"}