@techreport{oai:miyazaki-u.repo.nii.ac.jp:00003473,
 author = {Nishioka, Yusuke and 西岡, 祐介},
 month = {2020-06-21},
 title = {ベータ線を用いたX線CCDの空乏層厚測定},
 year = {},
 yomi = {ニシオカ, ユウスケ}
}