{"created":"2023-05-15T09:58:49.111916+00:00","id":2845,"links":{},"metadata":{"_buckets":{"deposit":"04467146-0c0b-44ec-9e14-96850ae107b2"},"_deposit":{"created_by":5,"id":"2845","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2845"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002845","sets":["73","73:36","73:36:330","73:36:330:323"]},"author_link":["15014","15010","7152","7150","15015","12078","15009"],"item_10002_alternative_title_1":{"attribute_name":"その他(別言語等)のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"MOS トランジスタ ノ バックゲート タンシ オ モチイタ コウセイド サンプル ホールド カイロ ノ ケントウ"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-08-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"134","bibliographicPageStart":"127","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this paper, we propose new sample-and-hold circuits, which are low ON-resistance by using backgate terminal of MOSFET. In the proposed circuits, the backgate terminal is used as a control terminal to change the threshold voltage (V_T) of MOSFET. In detail, the backgate is applied to a pulse at the moment of turning on. Using this technique, we can achieve the low ON-resistance. From the evaluation using HSPICE simulation with the 0.35μm CMOS processes parameters, we could confirm that value of ON-resistance decrease about 13% compared with conventional one.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮川, 昌士","creatorNameLang":"ja"},{"creatorName":"ミヤガワ, マサシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"15009","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酒井, 駿介","creatorNameLang":"ja"},{"creatorName":"サカイ, シュンスケ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"15010","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"田村, 宏樹","creatorNameLang":"ja"},{"creatorName":"タムラ, ヒロキ","creatorNameLang":"ja-Kana"},{"creatorName":"Tamura, 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Takako","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12078","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"淡野, 公一","creatorNameLang":"ja"},{"creatorName":"タンノ, コウイチ","creatorNameLang":"ja-Kana"},{"creatorName":"Tanno, Koichi","creatorNameLang":"en"}],"familyNames":[{"familyName":"淡野","familyNameLang":"ja"},{"familyName":"タンノ","familyNameLang":"ja-Kana"},{"familyName":"Tanno","familyNameLang":"en"}],"givenNames":[{"givenName":"公一","givenNameLang":"ja"},{"givenName":"コウイチ","givenNameLang":"ja-Kana"},{"givenName":"Koichi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"7152","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50260740","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50260740"}]},{"creatorNames":[{"creatorName":"Miyagawa, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15014","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sakai, Syunsuke","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"15015","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"engineering127-134.pdf","filesize":[{"value":"1.9 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"engineering127-134.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2845/files/engineering127-134.pdf"},"version_id":"67da9940-ad8c-4f0b-9707-2846e6883d7a"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"MOSトランジスタのバックゲート端子を用いた高精度サンプル・ホールド回路の検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"MOSトランジスタのバックゲート端子を用いた高精度サンプル・ホールド回路の検討","subitem_title_language":"ja"},{"subitem_title":"Consideration of High Performance Sample-and-Hold Circuit Using Backgate Terminal of MOS Transistor","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","323"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2013-12-26"},"publish_date":"2013-12-26","publish_status":"0","recid":"2845","relation_version_is_last":true,"title":["MOSトランジスタのバックゲート端子を用いた高精度サンプル・ホールド回路の検討"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2024-12-26T07:33:55.142319+00:00"}