{"created":"2023-05-15T09:58:45.241549+00:00","id":2770,"links":{},"metadata":{"_buckets":{"deposit":"02e92919-7640-4a50-a805-fc81dd84458b"},"_deposit":{"created_by":5,"id":"2770","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2770"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002770","sets":["73","73:36","73:36:330","73:36:330:323"]},"author_link":["12634","14196","25564","12047","14540","14535"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"ギャク コウシ マッピング ニヨル セイチョウ ショキ ノ InGaAs/GaAs(001) カイメン ノ ミスフィット テンイ ノ カイセキ","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-08-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"88","bibliographicPageStart":"85","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Distribution of misfit dislocations (MDs) formed at the interface of InGaAs/GaAs(001) structure with different InGaAs thickness was investigated by X-ray reciprocal space mapping (RSM) techniques. Satellite peaks (Ps) were observed at the side of InGaAs 004 Bragg peak in RSM. Ps peaks were originated from scattering by lattices deformed by MDs. Peak position and full width at half maximum of Ps represented the mean tilt angle of crystal lattices caused by MDs and variation of them. These results were agreement with the results of X-ray topography. Based on these results, the same analysis were performed on the films with different In composition.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松下, 卓哉","creatorNameLang":"ja"},{"creatorName":"マツシタ, タクヤ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"高比良, 潤","creatorNameLang":"ja"},{"creatorName":"タカヒラ, ジン","creatorNameLang":"ja-Kana"},{"creatorName":"Takahira, Jun","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"境, 健太郎","creatorNameLang":"ja"},{"creatorName":"サカイ, ケンタロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Sakai, Kentarou","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Maeda, Koji","creatorNameLang":"en"},{"creatorName":"前田, 幸治","creatorNameLang":"ja"},{"creatorName":"マエダ, コウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Maeda, Kouji","creatorNameLang":"en"}],"familyNames":[{},{},{},{}],"givenNames":[{},{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"鈴木, 秀俊","creatorNameLang":"ja"},{"creatorName":"スズキ, ヒデトシ","creatorNameLang":"ja-Kana"},{"creatorName":"Suzuki, Hidetoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsushita, Takuya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"高比良, 潤","creatorNameLang":"ja"},{"creatorName":"タカヒラ, ジン","creatorNameLang":"ja-Kana"},{"creatorName":"Takahira, Jun","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"engineering85-88.pdf","filesize":[{"value":"632.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"engineering85-88.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2770/files/engineering85-88.pdf"},"version_id":"2a35bb55-67ab-43b1-855a-1d5d61e20124"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"GaAs, lattice mismatched solar sell, reciprocal space mapping, misfit dislocation","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"逆格子マッピングによる成長初期のInGaAs/GaAs(001)界面のミスフィット転位の解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"逆格子マッピングによる成長初期のInGaAs/GaAs(001)界面のミスフィット転位の解析","subitem_title_language":"ja"},{"subitem_title":"Analysis of Misfit Dislocations at the Interface of (001) InGaAs/GaAs by Reciprocal Space Mapping","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","323"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2013-12-26"},"publish_date":"2013-12-26","publish_status":"0","recid":"2770","relation_version_is_last":true,"title":["逆格子マッピングによる成長初期のInGaAs/GaAs(001)界面のミスフィット転位の解析"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2023-11-20T05:40:38.574334+00:00"}