{"created":"2023-05-15T09:58:44.634778+00:00","id":2756,"links":{},"metadata":{"_buckets":{"deposit":"217c6451-b076-4d62-b117-02afafc7dc1c"},"_deposit":{"created_by":5,"id":"2756","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2756"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002756","sets":["73","73:36","73:36:330","73:36:330:321"]},"author_link":["12634","14443","14448","12047","14444","11920"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"コウブンカイノウ Xセン カイセツホウ ニヨル GaAs (001) ジョウ ノ フッカブツ コンショウマク ノ ケッショウ ヒョウカ","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-07-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"38","bibliographicPageStart":"35","bibliographicVolumeNumber":"40","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The strain of the Cal-xSrxF2 layers on GaAs grown by molecular beam epitaxy (MBE) has been investigated. The layers are analyzed using the high resolution X-ray diffraction (HRXRD). The in-plane and out-of-plane lattice parameters using reciprocal lattice mapping for the symmetric (004) and asymmetric (224) reciprocal lattice points. The reciprocal lattice points was broaden in all Ca1-xSrxF2 films despite the lattice matched film to the substrate. The lattice spacings of the film increased as the SrF_2 cell temperature increased. The correlation between the difference of the lattice constant in films and that in substrate and the degree of relaxation of the lattice in the films are found.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"筒井, 康吉","creatorNameLang":"ja"},{"creatorName":"ツツイ, ヤスヨシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"正木, 宏和","creatorNameLang":"ja"},{"creatorName":"マサキ, ヒロカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Masaki, Hirokazu","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Maeda, Koji","creatorNameLang":"en"},{"creatorName":"前田, 幸治","creatorNameLang":"ja"},{"creatorName":"マエダ, コウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Maeda, Kouji","creatorNameLang":"en"}],"familyNames":[{},{},{},{}],"givenNames":[{},{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"境, 健太郎","creatorNameLang":"ja"},{"creatorName":"サカイ, ケンタロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Sakai, Kentaro","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"尾関, 雅志","creatorNameLang":"ja"},{"creatorName":"オゼキ, マサシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ozeki, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsutsui, Yasuyoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"正木, 宏和","creatorNameLang":"ja"},{"creatorName":"マサキ, ヒロカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Masaki, Hirokazu","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"7engineering40_pp.35-38.pdf","filesize":[{"value":"476.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"7engineering40_pp.35-38.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2756/files/7engineering40_pp.35-38.pdf"},"version_id":"83fbc7f2-63a8-4c6b-b357-2aa2363f022d"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"HRXRD, Reciprocal Lattice Map, MBE, CaSrF2 Lattice constant","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高分解能X線回折法によるGaAs(001)上のフッ化物混晶膜の結晶評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高分解能X線回折法によるGaAs(001)上のフッ化物混晶膜の結晶評価","subitem_title_language":"ja"},{"subitem_title":"X-ray reciprocal space mapping in MBE growth of CaSrF2 on GaAs(001)","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","321"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-03-08"},"publish_date":"2012-03-08","publish_status":"0","recid":"2756","relation_version_is_last":true,"title":["高分解能X線回折法によるGaAs(001)上のフッ化物混晶膜の結晶評価"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2023-11-20T06:57:21.758822+00:00"}