{"created":"2023-05-15T09:58:43.711846+00:00","id":2739,"links":{},"metadata":{"_buckets":{"deposit":"5aa694d9-f301-4a4c-a564-6ce9796cb107"},"_deposit":{"created_by":5,"id":"2739","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2739"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002739","sets":["73","73:36","73:36:330","73:36:330:323"]},"author_link":["14346","6484","14344"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"テスト ケース ノ カシカ オ モクテキ トシタ テストヨウ ダイアグラム ノ テイアン","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2013-08-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"269","bibliographicPageStart":"263","bibliographicVolumeNumber":"42","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A software system becomes a large scale in recent years. As a result, test cases used in software testing have become a large scale. It is difficult to understand where the software system is tested by a large quantity of test cases. For this reason, testing diagrams to visualize test cases are proposed. To generate the testing diagrams, the test case and UML (Unified Modeling Language) diagram are compared and their common information is added to the UML diagram. This paper uses communication diagram and state machine diagram. Generating the testing diagrams can overlook the whole test cases. As a result, we can easily understand where the software system is tested by test cases. Moreover, the testing diagrams support that you find faults in the test cases and/or UML diagrams.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"浦田, 聖也","creatorNameLang":"ja"},{"creatorName":"ウラタ, セイヤ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"14344","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"0000000106573887","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"https://isni.org/isni/0000000106573887"}],"affiliationNames":[{"affiliationName":"宮崎大学","affiliationNameLang":"ja"},{"affiliationName":"University of Miyazaki","affiliationNameLang":"en"}]}],"creatorNames":[{"creatorName":"片山, 徹郎","creatorNameLang":"ja"},{"creatorName":"カタヤマ, テツロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Katayama, Tetsuro","creatorNameLang":"en"}],"familyNames":[{"familyName":"片山","familyNameLang":"ja"},{"familyName":"カタヤマ","familyNameLang":"ja-Kana"},{"familyName":"Katayama","familyNameLang":"en"}],"givenNames":[{"givenName":"徹郎","givenNameLang":"ja"},{"givenName":"テツロウ","givenNameLang":"ja-Kana"},{"givenName":"Tetsuro","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"6484","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"50283932","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://kaken.nii.ac.jp/ja/search/?qm=50283932"}]},{"creatorNames":[{"creatorName":"Urata, Seiya","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"14346","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"engineering263-269.pdf","filesize":[{"value":"570.8 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"engineering263-269.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2739/files/engineering263-269.pdf"},"version_id":"1830292e-beff-4492-8333-d8c25d11f0a0"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Software development, Software testing, Test case, Visualization, UML (Unified Modeling Language)","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"テストケースの可視化を目的としたテスト用ダイアグラムの提案","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"テストケースの可視化を目的としたテスト用ダイアグラムの提案","subitem_title_language":"ja"},{"subitem_title":"Proposal of Testing Diagrams for Visualizing Test Cases in Software Testing","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","323"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2014-01-06"},"publish_date":"2014-01-06","publish_status":"0","recid":"2739","relation_version_is_last":true,"title":["テストケースの可視化を目的としたテスト用ダイアグラムの提案"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2024-12-26T06:44:03.979848+00:00"}