{"created":"2023-05-15T09:58:42.506514+00:00","id":2716,"links":{},"metadata":{"_buckets":{"deposit":"eec1c8ae-caf4-4884-838e-5460ffaf6ae7"},"_deposit":{"created_by":5,"id":"2716","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2716"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002716","sets":["73","73:36","73:36:330","73:36:330:322"]},"author_link":["12634","14196","12044","12047","14444","11920"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"コウブンカイノウ Xセン カイセキホウ ニヨル GaAs キバンジョウ ノ フッカブツ ハクマク ケッショウ ノ ヒョウカ","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2012-07-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"159","bibliographicPageStart":"155","bibliographicVolumeNumber":"41","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The crystal structure of Ca_1-xSr_xF_2 films (x =0.3~0.7) grown on GaAs(001) by molecular beam epitaxy was studied. The composition of Ca_1-xSr_xF_2 film was changed by SrF_2 cells temperature. The film thickness were 100 to 300 nm. The lattice constants of <001> and <110> direction of the films were determined by rocking curve measurement, the (004) and (224) reciprocal lattice maps by the high resolution X-ray diffractometry. The lattice constants of both directions increased as the SrF_2 composition increasing. The lattice constant of the films which was expected for the 0.1% lattice mismatched could be measured.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"正木, 宏和","creatorNameLang":"ja"},{"creatorName":"マサキ, ヒロカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Masaki, Hirokazu","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Maeda, Koji","creatorNameLang":"en"},{"creatorName":"前田, 幸治","creatorNameLang":"ja"},{"creatorName":"マエダ, コウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Maeda, Kouji","creatorNameLang":"en"}],"familyNames":[{},{},{},{}],"givenNames":[{},{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"境, 貴洋","creatorNameLang":"ja"},{"creatorName":"サカイ, タカヒロ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"尾関, 雅志","creatorNameLang":"ja"},{"creatorName":"オゼキ, マサシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ozeki, Masashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"鈴木, 秀俊","creatorNameLang":"ja"},{"creatorName":"スズキ, ヒデトシ","creatorNameLang":"ja-Kana"},{"creatorName":"Suzuki, Hidetoshi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"正木, 宏和","creatorNameLang":"ja"},{"creatorName":"マサキ, ヒロカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Masaki, Hirokazu","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Sakai, Kentaro","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"engineering41_155-159.pdf","filesize":[{"value":"1.0 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"engineering41_155-159.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2716/files/engineering41_155-159.pdf"},"version_id":"e5f5e174-aaf5-445d-b779-439144a2a7b6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"HRXRD, Reciprocal lattice map, MBE, Epitaxial grown","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高分解能X線回折法によるGaAs基板上のフッ化物薄膜結晶の評価","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高分解能X線回折法によるGaAs基板上のフッ化物薄膜結晶の評価","subitem_title_language":"ja"},{"subitem_title":"Structure Analysis of Fluoride Crystal on GaAs by High-Resolution X-ray Diffractometry","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","322"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-10-31"},"publish_date":"2012-10-31","publish_status":"0","recid":"2716","relation_version_is_last":true,"title":["高分解能X線回折法によるGaAs基板上のフッ化物薄膜結晶の評価"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2023-11-20T06:57:21.537841+00:00"}