@article{oai:miyazaki-u.repo.nii.ac.jp:00002480,
 author = {中川, 匠 and 吉原, 郁夫 and Yoshihara, Ikuo and 山森, 一人 and Yamamori, Kunihito and 安永, 守利 and Yasunaga, Moritoshi and Nakagawa, Takumi},
 journal = {宮崎大学工学部紀要, Memoirs of Faculty of Engineering, University of Miyazaki},
 month = {Aug},
 note = {ABSTRACT 
Alignment based on DP-matching is used to extract unknown feature pattern embedd ed in genome 
sequence. To extract feature pattem with base length n, complete set of similarity of c andidate pattern 
with base length N = 2, 3, ・ ・ ・ , n is required. When extending base length n, number of candidate 
pattern and execution time i ncrease exponential order O(4n+1 ). This paper propose a new faster method 
of extracting feature pattern by reusing similartiy which is calculated past step. The method enable 
extracting feature pattern with base length n = 10 to speed up as much as 9 times than conventional 
method.},
 pages = {257--262},
 title = {ゲノム解析に用いるDPマッチングの分割統治法による高速化},
 volume = {35},
 year = {2006},
 yomi = {ナカガワ, タクミ and ヨシハラ, イクオ and ヤマモリ, クニヒト and ヤスナガ, モリトシ}
}