{"created":"2023-05-15T09:58:29.350543+00:00","id":2455,"links":{},"metadata":{"_buckets":{"deposit":"795228f7-ea58-4b20-8f65-ad5d56b9d494"},"_deposit":{"created_by":5,"id":"2455","owner":"5","owners":[5],"pid":{"revision_id":0,"type":"depid","value":"2455"},"status":"published"},"_oai":{"id":"oai:miyazaki-u.repo.nii.ac.jp:00002455","sets":["73","73:36","73:36:330","73:36:330:316"]},"author_link":["12409","15984","12416","12417","7147","12424","6637","6647","11962","12907","12411","12419"],"item_10002_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"22kV キキ チョッケツ タンマツ ニ オケル ブブン ホウデン ケンシュツ ニ ヨル レッカ シンダンホウ ノ カイハツ","subitem_alternative_title_language":"ja-Kana"}]},"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-08-30","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"112","bibliographicPageStart":"107","bibliographicVolumeNumber":"35","bibliographic_titles":[{"bibliographic_title":"宮崎大学工学部紀要","bibliographic_titleLang":"ja"},{"bibliographic_title":"Memoirs of Faculty of Engineering, University of Miyazaki","bibliographic_titleLang":"en"}]}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Abstract \nRecently, power failure were caused by dielectric breakdown occurred at the cable joint of \n22kV network in a substation, because insulation deterioration diagnosis technique in electric \npower systems is not enough established yet. \nThe EPR used in this experiment is the same material for insulation of actual cable splicing \nof the 22kV network. Partial discharge in EPR sheet was detected by two kind of sensors; AE \n(Acoustic Emission) sensor and VHF (Very High Frequency) antenna. The basic propagation \ncharacteristics of acoustic wave in the EPR and partial discharges in a simulated void of the \nEPR were measured. Next, partial discharge in cable joint was measured by AE sensor, and \nthen discharge point could be found from the signals of three AE sensors. Last, a simple and \ncompact AE measurement system was developed for detecting partial discharge in the actual \ncable of 22kV network.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"宮崎大学工学部","subitem_publisher_language":"ja"},{"subitem_publisher":"Faculty of Engineering, University of Miyazaki","subitem_publisher_language":"en"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00732558","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"05404924","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"加藤, 栄士","creatorNameLang":"ja"},{"creatorName":"カトウ, エイジ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"猪崎, 一哉","creatorNameLang":"ja"},{"creatorName":"イザキ, カズヤ","creatorNameLang":"ja-Kana"},{"creatorName":"Izaki, Kazuya","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"秋本, 雄樹","creatorNameLang":"ja"},{"creatorName":"アキモト, ユウキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"竹之内, 修","creatorNameLang":"ja"},{"creatorName":"タケノウチ, オサム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"本田, 親久","creatorNameLang":"ja"},{"creatorName":"ホンダ, チカヒサ","creatorNameLang":"ja-Kana"},{"creatorName":"Honda, Chikahisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大坪, 昌久"},{"creatorName":"オオツボ,  マサヒサ","creatorNameLang":"ja-Kana"},{"creatorName":"Otsubo, Masahisa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"馬場, 誠一郎","creatorNameLang":"ja"},{"creatorName":"ババ, セイイチロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Baba, Seiichirou","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"波田, 浩行","creatorNameLang":"ja"},{"creatorName":"ハダ, ヒロユキ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kato, Eiji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"猪崎, 一哉","creatorNameLang":"ja"},{"creatorName":"イザキ, カズヤ","creatorNameLang":"ja-Kana"},{"creatorName":"Izaki, Kazuya","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Akimoto, Yuuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takenouchi, Osamu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"馬場, 誠一郎","creatorNameLang":"ja"},{"creatorName":"ババ, セイイチロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Baba, Seiichirou","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hada, Hiroyuki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2020-06-21"}],"displaytype":"detail","filename":"KJ00004439497.pdf","filesize":[{"value":"827.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"KJ00004439497.pdf","url":"https://miyazaki-u.repo.nii.ac.jp/record/2455/files/KJ00004439497.pdf"},"version_id":"17ab03c2-ebd2-4e0d-a7ff-ac7e1274d960"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Partial Discharge, AE sensor, Antenna, Deterioration Diagnosis Technique","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"22kV機器直結端末における部分放電検出による劣化診断法の開発","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"22kV機器直結端末における部分放電検出による劣化診断法の開発","subitem_title_language":"ja"},{"subitem_title":"Development of Deterioration Diagnosis Technique by Detection of Partial Discharge in a Cable Joint of 22kV Distribution System","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"5","path":["73","36","330","316"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2007-06-28"},"publish_date":"2007-06-28","publish_status":"0","recid":"2455","relation_version_is_last":true,"title":["22kV機器直結端末における部分放電検出による劣化診断法の開発"],"weko_creator_id":"5","weko_shared_id":2},"updated":"2023-11-28T05:02:04.450730+00:00"}